Agilent Technologies’ ZIF Probe Head Extended to Protocol Layer Testing and Debugging for PCI Express®

Agilent Technologies Announces Industry’s Most Cost-Effective PCI Express® 3.0 Flying Lead Probe

SANTA CLARA, Calif., April 5, 2012 – Agilent Technologies Inc. (NYSE: A) today announced a new flying lead solder-down probe for PCI Express 3.0 protocol analysis. The new U4324A probe, for use with Agilent’s U4301A protocol analyzer module, is the industry’s most cost-effective solder-down probing solution. “The PCI Express flying lead probe is…

Agilent Technologies’ Introduces Complete Test Solution for PCI Express® 3.0 Featuring the New Digital Test Console

SANTA CLARA, Calif., DesignCon, Booth 301, Feb. 1, 2010 -- Agilent Technologies Inc. (NYSE: A) today introduced its PCIe®3.0 test solutions and the new Agilent Digital Test Console. The Digital Test Console is the industry's only complete and integrated x1 through x16 protocol analyzer and exerciser solution for the PCI…

Agilent Technologies Introduces First Fully Integrated Protocol Viewer for Automated PCI Express® 3.0 Testing

SANTA CLARA, Calif., Sept. 6, 2011 – Agilent Technologies Inc. (NYSE: A) today announced the industry’s first fully integrated protocol viewing application for PCI Express® 3.0. The software combines packet viewing and analog waveform annotation with advanced packet and symbol searching capabilities in a single oscilloscope-based tool. The software helps engineers identify…

How Google and Intel use Calibre DesignEnhancer to reduce IR drop and improve reliability

Sponsored by Siemens Digital Industries Software

Through real-world examples from Intel and Google, we highlight how Calibre’s DesignEnhancer maximizes layout modifications while ensuring DRC compliance.

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Advances in Solar Energy and Battery Technology

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Click here for more information about onsemi & Würth Elektronik Solar Inverter Solutions

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Agilent Technologies’ ZIF Probe Head Extended to Protocol Layer Testing and Debugging for PCI Express®

Related

Agilent Technologies Announces Industry’s Most Cost-Effective PCI Express® 3.0 Flying Lead Probe

Agilent Technologies’ Introduces Complete Test Solution for PCI Express® 3.0 Featuring the New Digital Test Console

Agilent Technologies Introduces First Fully Integrated Protocol Viewer for Automated PCI Express® 3.0 Testing