Synopsys extends DFTMAX compression to reduce the cost of pin-limited test
Delivers predictable high compression with only one pair of test data pins
MOUNTAIN VIEW, Calif., November 2, 2009 — Synopsys, Inc. (Nasdaq:SNPS), a world leader in software and IP for semiconductor design, verification and manufacturing, today announced a new capability in DFTMAX(tm) compression that significantly reduces the cost of test for designs and methodologies that mandate very few test pins. Extending Synopsys’ patented adaptive scan technology with a high-performance, low-pin interface to the tester allows designers to achieve predictable compression of up to 100X or more with only one pair of test data pins. As designers … Read More → "Synopsys extends DFTMAX compression to reduce the cost of pin-limited test"