Improved collaboration, lifecycle management and measurement capabilities target semiconductor, photovoltaic and thin film MEMs sectors

Dortmund, Germany – 6th October 2009 – Process Relations has today launched the latest version of its XperiDesk Process Development Execution System (PDES) software. XperiDesk 2009.2 delivers a new module, XperiSim, that provides a generic simulation and calculation interface, together with the management of simulation and calculation modules. These additional tools combined with the core capabilities of the XperiDesk system, give engineers even more time to focus on tackling the technical challenges involved with what-if process development, rather than data collection and management.

ASQED 2010, August 2-3, Penang, Malaysia

SAN JOSE, CA, PENANG, Malaysia – October 6, 2010 – The International Society for Quality Electronic Design (ISQED) today announced that its 2nd annual Asia Symposium on Quality Electronic Design (ASQED) will be held in Penang, Malaysia on August 2-3, 2010. Recipients of the ASQED 2009 Best Research Papers awards included Taiwan’s National Chiao Tung University, the Indian Institute of Science, and Texas Instruments (India).

ASQED 2009 in Kuala Lumpur, Malaysia attracted over 350 foreign and local participants, and featured five keynote speeches, two tutorials and over 80 technical presentations. It was the … Read More → "The International Society for Quality Electronic Design (ISQED) Announces 2010 Asia Symposium on Quality Electronic Design (ASQED), 2009 Award Recipients"

SANTA CLARA, Calif., Oct. 5, 2009 — Agilent Technologies Inc. (NYSE: A) today introduced 200-MHz and 800-MHz, high-voltage differential probes. The differential probes provide superior general-purpose differential signal measurements required for today’s high-speed power measurements, vehicle bus measurements and digital system designs.

The Agilent N2792A and N2793A differential probes offer 10:1 attenuation, allowing them to be used for a broad range of applications. The probe comes with various probe tip accessories for use with small and large components in tight places.

The differential probes have an input resistance of 1 M? (for N2792A) and 200 … Read More → "Agilent Technologies Introduces Probes for General-Purpose Differential Signal Measurements"

MOUNTAIN VIEW, Calif. – October 6, 2009 – Synopsys, Inc. (NASDAQ: SNPS), a world leader in software and IP for semiconductor design, verification and manufacturing, today announced that the U.S. Department of Energy’s National Renewable Energy … Read More → "Synopsys’ Sentaurus TCAD used to simulate solar cell performance characteristics at NREL Simulation provides key insights in the design and optimisation of solar cells"

KAWASAKI (Japan), DUESSELDORF (Germany), PUNE (India), SANTA CLARA, Calif. (USA), October 6, 2009 – NEC Electronics Corporation (TSE:6723) and KPIT Cummins (BSE: 532400; NSE: KPIT), today announced the availability of an AUTOSAR 3.0-compatible software package for various hardware platforms. This … Read More → "NEC Electronics and KPIT Cummins Collaborate on New AUTOSAR 3.0-Compatible Solution"

SANTA CLARA, Calif., Oct. 5, 2009 — Agilent Technologies Inc. (NYSE: A) today announced that SystemVue version 2009.08 is now available for download. It features a number of new capabilities including an automated link that unlocks RF-DSP co-design and a fully … Read More → "Agilent Technologies’ SystemVue 2009.08 Unlocks RF-DSP Co-design, Custom Flow for “Model-Based Design”"

IRVINE, Calif.–(BUSINESS WIRE)–Custom Silicon Solutions, Inc. (CSS) (www.CustomSiliconSolutions.com), a leading fabless semiconductor company that provides turn-key custom ASICs (Application Specific Integrated Circuits) and standard product solutions, has won a new Military ASIC development … Read More → "Custom Silicon Solutions Wins New Military ASIC Development Program"

Eleventh Annual Boston Event is Part of Largest User Conference Program in EDA

MOUNTAIN VIEW, Calif., Oct. 5 /PRNewswire-FirstCall/ — Synopsys, Inc. (NASDAQ:SNPS) , a world leader in software and IP for semiconductor design, verification and manufacturing, today announced the Best Paper Awards for the eleventh annual Synopsys Users’ Group (SNUG®) conference in Boston, Mass., held from September 21-22. SNUG conference attendees and the SNUG Technical Committee awarded first place to Garrett Marshall, Jalpa Shah and Scott Stanslaski of Medtronic for “XA Verification in Implantable Medical Design.” Second place was awarded to Clifford Cummings of Sunburst Design, … Read More → "Synopsys Recognizes Technical Excellence at SNUG Boston Conference"

Two New Models and Three New Applications Deliver Broadest Measurement Capability

SANTA CLARA, Calif., Oct. 1, 2009 — Agilent Technologies Inc. (NYSE: A) today expanded its mixed-signal and digital-storage oscilloscope portfolio with two lower-cost 600-MHz Infiniium 9000 Series models, three new application packages and GPIB compatibility. The 9000 Series is the industry’s first oscilloscope family to offer bandwidths from 600 MHz to 4 GHz, and it includes the industry’s first mixed signal oscilloscope to support MIPI and SATA industry standards.

Oscilloscopes are the primary tools engineers use to test and debug electronic designs, and engineers need increasingly broad measurement … Read More → "Agilent Technologies Expands Infiniium 9000 Series Lineup with 600-MHz Oscilloscopes, First Mixed-Signal Scope Supporting MIPI and SATA Applications"

Toolkit Adds Enhanced ATML Functionality to the NI TestStand Platform

NEWS RELEASE – Sept. 15, 2009 – National Instruments today announced the NI TestStand ATML Toolkit to help engineers reduce development and maintenance time by expanding test system component interoperability and increasing test system documentation. The Automatic Test Markup Language (ATML) is an IEEE standard consisting of XML document formats that describe different aspects of a test system. The new toolkit adds support for the ATML TestDescription standard and improves support for the ATML TestResults standard in NI TestStand. The toolkit can be downloaded from the National Instruments … Read More → "National Instruments Introduces the NI TestStand ATML Toolkit for Automated Test Application Development"