Agilent Technologies’ Introduces Complete Test Solution for PCI Express® 3.0 Featuring the New Digital Test Console
SANTA CLARA, Calif., DesignCon, Booth 301, Feb. 1, 2010 — Agilent Technologies Inc. (NYSE: A) today introduced its PCIe®3.0 test solutions and the new Agilent Digital Test Console. The Digital Test Console is the industry’s only complete and integrated x1 through x16 protocol analyzer and exerciser solution for the PCI Express 3.0 specification, currently under development within the PCI SIG®. The Digital Test Console offers the industry’s largest capture buffer and fastest download interface, with multiple non-intrusive probing options that employs the latest ESP technology. The Digital Test Console was designed to assist with PCIe 3.0 development and provide accurate test … Read More → "Agilent Technologies’ Introduces Complete Test Solution for PCI Express® 3.0 Featuring the New Digital Test Console"