Agilent Technologies’ Software Fundamentally Improves, Automates STMicroelectronics’ Device Modeling On-Wafer Measurements
SANTA CLARA, Calif., Nov. 15, 2010 — Agilent Technologies Inc. (NYSE: A) today announced that its IC-CAP Wafer Professional (WaferPro) software has been successfully deployed at STMicroelectronics. WaferPro adds new capabilities toAgilent’s Integrated Circuit and Analysis Program (IC-CAP) software platform to enable efficient, automated on-wafer measurements for device modeling applications.
STMicroelectronics uses IC-CAP as a device modeling platform to extract semiconductor device models for silicon devices (CMOS and BJT, for example). … Read More → "Agilent Technologies’ Software Fundamentally Improves, Automates STMicroelectronics’ Device Modeling On-Wafer Measurements"