News – Page 2063 – EEJournal

EpiGaN raises capital for GaN-on-Si production

July 5, 2011

Hasselt, 5th July 2011. EpiGaN is pleased to announce that it has closed its first capital round of € 4 million, which will allow it to start volume production of GaN-on-Si epitaxial material for the next-generation efficient power electronics.

Incorporated in 2010, EpiGaN was founded by Dr Marianne Germain, CEO, Dr Joff Derluyn, CTO and Dr Stefan Degroote, COO, as a spin-off of imec. For more than 10 years, the founders jointly developed state-of-the-art GaN-on-Si technology on 4” and 6” wafers at imec, part of which has been licensed to EpiGaN. They are today joined by a strong consortium of investors … Read More → "EpiGaN raises capital for GaN-on-Si production"

X-FAB Adds eFlash to High-Voltage 0.18 Micrometer Foundry Offering

July 5, 2011

Erfurt, Germany, July 5, 2011 – X-FAB Silicon Foundries today enhanced its XH018 0.18 micrometer high-voltage process with a highly reliable new embedded Flash solution. It offers the industry’s lowest mask count of 32 mask layers in total for the modular combination of digital, analog and high-voltage features with embedded Flash. The flash module itself requires only two masks. This new solution results in the industry’s most cost-effective System-on-chip (SoC) platform. Supporting … Read More → "X-FAB Adds eFlash to High-Voltage 0.18 Micrometer Foundry Offering"

Ultra compact 20 Watt DC-DC converters achieve 51W/in³ power density

July 5, 2011

XP Power today announced additions to its range of low power metal cased DC-DC converters with the launch of the 20 Watt JCM20 and JTK20 series. Aimed at space constrained portable applications, these highly efficient board mounted converters provide either single or dual regulated outputs from an ultra compact 1 x 1 x 0.39 inch (25.4 x 25.4 x 9.90 mm) package. Achieving an industry leading power density of up to 51 Watts per cubic inch and an efficiency of up to 89%, these tiny units are ideal for applications where PCB space for the converter needs to be kept to the minimum and an industry standard package … Read More → "Ultra compact 20 Watt DC-DC converters achieve 51W/in³ power density"

Extending the Reach of Free Boundary-scan Tools

July 5, 2011

Eindhoven, The Netherlands – 5^th July 2011. JTAG Technologies is proud to announce the latest extension to its popular JTAGLive family of boundary-scan powered design and repair debug tools for PCBs. JTAGLive Buzz-plus is an extension to the acclaimed free-of-charge Buzz tool that was launched in 2009.

While Buzz allows the user to sample activity on boundary-scan pins and test continuity of nets across a circuit board – and is free to all users – Buzz-plus extends … Read More → "Extending the Reach of Free Boundary-scan Tools"

Xilinx to Deliver Industry Perspective at SEMICON West 2011 at SEMI/Gartner Market Symposium & ‘3D in the Deep Submicron Era’ TechXSPOT Session

July 5, 2011

SAN JOSE, Calif., July 5, 2011 – Xilinx, Inc. (NASDAQ: XLNX) today announced its participation in the SEMI/Gartner Market Symposium and 3D in the Deep Submicron Era TechXSPOT session at Read More → "Xilinx to Deliver Industry Perspective at SEMICON West 2011 at SEMI/Gartner Market Symposium & ‘3D in the Deep Submicron Era’ TechXSPOT Session"

Siltronic AG Joins imec’s GaN-on-Si Research Program to Develop Technology for Next-Gen Power Semiconductors and LEDs

July 1, 2011

Munich / Leuven (Belgium), July 1, 2011 – Siltronic AG and the Belgian nano-electronics research institute imec have concluded an agreement to collaborate on the development of silicon wafers with a gallium nitride layer as partner of imec’s GaN-on-Si industrial affiliation program (IIAP). The endeavor aims to enable production of solid-state lighting (e.g. LEDs) and power semiconductors of the next generation on 200 mm silicon wafers.

Gallium nitride (GaN) is a very promising material. Combining superior electron mobility, high breakdown voltage and good thermal conductivity, it is particularly suitable for optoelectronics and advanced power semiconductors. These are used, … Read More → "Siltronic AG Joins imec’s GaN-on-Si Research Program to Develop Technology for Next-Gen Power Semiconductors and LEDs"

SMX® RTOS Now Available for Kinetis™ K60 Cortex™-M4 Microcontrollers from Freescale

July 1, 2011

Costa Mesa, California, June 30, 2011 — Micro Digital, Inc. is pleased to offer SMX^® RTOS support for the Kinetis™ K60 Cortex™-M4 microcontrollers from Freescale. This includes immediate availability of the smx preemptive real-time multitasking kernel, smxUSBH USB host stack, smxUSBD USB device stack, smxNS TCP/IP stack, and smxFS FAT file system with MMC/SD card driver.

SMX RTOS fully supports the Freescale K60 Tower development board TWR-K60N512 with the IAR Embedded Workbench for ARM toolsuite. smxAware extends … Read More → "SMX® RTOS Now Available for Kinetis™ K60 Cortex™-M4 Microcontrollers from Freescale"

Curtiss-Wright Controls Introduces Industry’s First NVIDIA® GPGPU OpenVPX™ Engine based on NVIDIA Fermi architecture

July 1, 2011

ASHBURN, VA – June 30, 2011 – Curtiss-Wright Controls Embedded Computing (CWCEC), a business group of Curtiss-Wright Controls and a leading designer and manufacturer of commercial off-the-shelf (COTS) VME, VPX, OpenVPX™ and CompactPCI products for the rugged deployed aerospace and defense market, has announced its first general purpose graphics processing unit (GPGPU)- multi-core engine, theVPX6-490 GPU Application Accelerator. The VPX6-490 features … Read More → "Curtiss-Wright Controls Introduces Industry’s First NVIDIA® GPGPU OpenVPX™ Engine based on NVIDIA Fermi architecture"

Konica Minolta Accelerates Hardware Debugging with EVE’s ZEMI-3 Transaction-Level Modeling Methodology

June 30, 2011

SAN JOSE, CALIF. –– June 30, 2011 –– Konica Minolta Technology Center, Inc., of Tokyo, Japan today announced that it accelerated its hardware debugging process through the use of EVE’s ZeBu hardware-assisted verification platform and ZEMI-3 transaction-level modeling methodology.

Over the past year, Konica Minolta has deployed ZeBu to accelerate the simulation of its high-speed, high-performance large-scale integrated circuits (LSIs) used in image processing. Konica Minolta designers adopted EVE’s ZEMI-3 transaction-level … Read More → "Konica Minolta Accelerates Hardware Debugging with EVE’s ZEMI-3 Transaction-Level Modeling Methodology"

Enea Announces FastTrack Evaluation Kit for Freescale’s QorIQ Qonverge™ Products

June 30, 2011

STOCKHOLM, Sweden, June 22, 2011 – Enea® (NASDAQ OMX Nordic:ENEA) today announced that it is launching its first iteration of FastTrack, a software evaluation kit for Freescale’s QorIQ Qonverge™(www.enea.com/qonverge) products. FastTrack combines many of Enea’s proven runtime software products … Read More → "Enea Announces FastTrack Evaluation Kit for Freescale’s QorIQ Qonverge™ Products"