Describing User-Defined Faults
In today’s article on cell-aware fault modeling, we described how specific layout-dependent faults can be accounted for in the test suite, increasing the test coverage beyond what stuck-at modeling provides and yet keeping the vector count down below what gate-exhaustive modeling would require.
But there has to be some way of defining these specific “user-defined” faults so that the test generation program can include them in the test suite.
Mentor devised their so-called “User-Defined Fault Model”, or UDFM, language … Read More → "Describing User-Defined Faults"