editor's blog
Subscribe Now

A Buttable X-Ray Detector

Most image sensors receive light that has passed through a lens of some sort. This means that a large area can be photographed, for example, and sensed on a chip that is extremely small by comparison with the scene itself.

Not so with medical X-ray imaging. The target sensor gets a full-sized image. Not so hard for dental work, but more challenging for mammography or other full- or partial-body scans.

It’s typically hard, therefore, to provide a solid-state target that can provide seamless coverage. No matter how large they’ve been, they’ve had pixel addressing circuitry on two sides, meaning that you can’t tile them together. (At least not without having “blind stripes” where the decode logic blocks meet up…)

TowerJazz and Tanner worked together with the UK Science and Technology Facility Council’s Rutherford Appleton Labs to develop a unique decoding scheme that allowed them to restrict themselves to only one edge for the circuitry, allowing pixels all the way up to the other three edges. That means that you can tile them in any 2xN configuration.

With each sensor being basically the size of a 200-mm wafer (6.7 Mpixels), they can handle mammography applications with a 2×2 arrangement; longer targets are possible for other applications.

As to how they did the decoding? Yeah… they’re being coy about that. It seems to be largely an analog approach, which is where Tanner contributed to the process. But more details weren’t forthcoming…

You can read more in their release.

EDAS0088-STFCimagesensor_550px.jpg

Leave a Reply

featured blogs
May 14, 2025
If you're based in Coimbatore and you're looking for a bright and highly motivated ASIC/FPGA intern, I have great news!...

featured paper

How Google and Intel use Calibre DesignEnhancer to reduce IR drop and improve reliability

Sponsored by Siemens Digital Industries Software

Through real-world examples from Intel and Google, we highlight how Calibre’s DesignEnhancer maximizes layout modifications while ensuring DRC compliance.

Click here for more information

featured chalk talk

Shift Left Block/Chip Design with Calibre
In this episode of Chalk Talk, Amelia Dalton and David Abercrombie from Siemens EDA explore the multitude of benefits that shifting left with Calibre can bring to chip and block design. They investigate how Calibre can impact DRC verification, early design error debug, and optimize the configuration and management of multiple jobs for run time improvement.
Jun 18, 2024
75,692 views